If linearization or profiling charts are to be measured with the scan function of the TECHKON SpectroDens, it may happen under difficult conditions that the first or last field of a scan row is read in with a different number of sub measurements. In extreme cases this can lead to inaccuracies in the chart measurements. Uneven movement of the device over the target can also cause problems in accurately capturing the measurement fields. As a result, the quality of linearizations or profiles generated from such measurements may be compromised.

To solve this problem, TECHKON has introduced two new parameters in the device software: